Large GaN single-crystal substrates with
low dislocation density are the key materials for the commercial production of GaN-based
laser diodes. We developed a new method to reduce the dislocations, named
dislocation elimination by the epitaxial-growth with inverse-pyramidal pits
(DEEP). A thick GaN film is epitaxially grown on a GaAs substrate with
hydride vapor-phase epitaxy and then is separated from the GaAs substrate.
The thick GaN layer grows with numerous large inverse-pyramidal pits.
As the growth proceeds, dislocations in the GaN film are concentrated
to the center of the pit and a wide area with low dislocation density is formed
within the pit except the center area. To control the dislocation artificially,
the position of the pits is fixed at a predetermined position by means of the
selective growth of different polarity GaN film. This process was
named as advanced DEEP (A-DEEP).GaN substrates with the A-DEEP method
satisfied all the requirements for the violet laser diodes. We continued to
develop new GaN substrates such as large-diameter c-plane substrates as
well as nonpolar/semipolar GaN substrates. In particular, we overcame
the green gap problem and developed the world's first true green laser diodes
by selecting an optimal crystal plane.
Source:IEEE
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